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TEM
induction furnace
characterization of NiTi
mechanical testing
directional soldification
transmission electron microscope
JEOL JEM-3010 transmission electron microscope
acceleration voltage
100 to 300 kV
electron source
LaB6 cathode
point resolution
0.17 nm
line resolution
0.14 nm
magnification range
max 1.200.000x
additional equipment:
double tilt sample holder (cooled)
EDX with scanning unit
CCD - camera
Impressum
© by maaja Design & Konzepte